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反射率 发射率性能测试仪器
- LPSR 300:

实验室用便携式光谱反射率测定仪
Laboratory Portable SpectroReflectometer
(LPSR)
独特的采用积分球对大部分的材料表面进行半球光谱反射率测定,光谱范围250 to 2800 nm 。主要根据ASTM E903 规范,对太阳吸收进行测定 .可同时提供用于真空环境测试版本 LPSR 300V.

- TEMP 2000A:

便携式发射率/反射率测定仪
Portable emissometer/reflectometer

可在3-35 微米范围内测试半球反射率测试(t
otal hemispherical reflectances) ,提供法线方向和 半球方向300K 环境条件下的发射率测定。可取代已经停产的 Gier Dunkle DB 100 红外反射率测定计I,并在性能和保养性方面都优于该型号反射计。符合ASTM E408 标准。

TESA 2000 Portable Reflectometer/Emissometer and Solar Absorption/Reflectometer in use
- TESA 2000:

带有太阳反射率测试功能的便携式发射率/反射率测试仪
Portable emissometer/reflectometer combined with a solar reflectometer
可在3-35 微米范围内测试半球反射率测试(total hemispherical reflectances) ,提供法线方向和 半球方向300K 环境条件下的发射率测定。可取代已经停产的 Gier Dunkle DB 100 红外反射率测定计I,并在性能和保养性方面都优于该型号反射计。符合ASTM E408 标准。并集成了光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,紧凑、轻便、适合在野外和实验室使用.

- LPIR FT:

实验室用红外便携式反射率测量仪
Laboratory Portable Infrared Reflectometer
(LPIR)

测量红外半球反射率,波长范围2.5 - 25 微米,并计算显示发射率,同时可提供真空环境使用的版本 LPIR FT V.

LPIR FT Laboratory Portable FTIR Spectroreflectometer
TEMP 2000A 便携式红外发射率/反射率测试仪
Label阅读: 1090

"The simplest method of determining emittance is with a portable infrared reflectometer such as the [Gier Dunkle] DB100 or the AzTek [AZ Technology] Temp 2000."

-- Kauder, L. (2005) NASA/TP-2005-212792, pg. 23

TEMP 2000A便携式红外发射率/反射率测定仪,可在3-35 微米范围内测试半球反射率测试(total hemispherical reflectances) ,提供法线方向和 半球方向300K 环境条件下的发射率测定。

 可取代已经停产的业界标准 Gier Dunkle DB 100 红外反射率测定计,并在性能和保养性方面都优于该型号反射计。并配备电池、充电器等,以及适应喷气式飞机飞行环境的便携箱,紧凑、轻便、适合在野外和实验室使用。符合ASTM E408 标准。

TEMP2000A中采用的光学元件、镀膜材料决定了其还可以在更宽的波长范围进行测试。

TESA2000是在TEMP 2000A基础上增加光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,主要用于太空材料太阳吸收特性测试。

 

Wavelength <3um to >35um (not limited by filters, windows, etc.)
Measurement accuracy (for specular and diffuse samples) - ± 1% of full scale for gray samples
- ± 3% of full scale for non-gray samples
Repeatability - ± 0.5% of full scale or better
Sample type Any Sample, including foils, insulators, etc.
Sample size and geometry -Flat Surfaces: ≥ 0.4 inches (1 cm) diameter
-
Concave Surfaces: 6.5 inches (16.5 cm) diameter
-
Convex Surfaces: 1 inch (2.5 cm) diameter
Sample temperature Room Temperature, Ambient
Displayed properties -Infrared Reflectance
-
Normal Emittance (300K)
-
Hemispheric emittance (300K)
Readouts

-Digital LCD panel meter
-Selectable IR emittance or reflectance display

Measurement range (reflectance) 0.00 to 1.00

Dimensions

-Optical Head: 5.25" diameter x 6.8" long
-Control and Display Unit: 4.5 x 7.75 x 7 inches
-Carry Case: 12.5 x 17 x 11 inches

Weight -Optical Head: 5 pounds
-Control and Display Unit: 4 pounds
-Carry Case: 11 pounds
Warranty 1 year parts and labor
TESA 2000 太阳光谱反射率及发射率测量仪
Label阅读: 1089

 

Lab setting where samples may be sat atop unit.
TESA 2000 Portable Reflectometer/Emissometer and Solar Absorption/Reflectometer in use
Portable usage with battery pack and vest

TESA2000是在TEMP 2000A基础上增加光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,主要用于材料太阳光谱吸收、反射特性测试。

 AZ Technology's TESA 2000 Portable Emissometer/Reflectometer and Solar Reflectometer, is compact, lightweight, rugged, and ergonomically engineered for ease of use in the field or in the laboratory to determine ambient temperature total emittance and solar reflectance of test surfaces.

The TESA 2000 can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken, or as a portable unit (bottom right image).

The TESA 2000 provides in a single unit:

1) A portable emissometer/reflectometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Thus, performing the same measurement as the TEMP 2000A (the recognized replacement for the no longer produced Gier Dunkle DB-100 IR Reflectometer**), providing improved emittance determination performance and maintainability, and in accordance with the ASTM E408 standard.

2) A portable solar reflectometer that performs optically integrated total hemispheric reflectance measurements.

The TESA 2000 optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology's patented ellipsoid collector (Patent Number 5,659,397) that allows compactness for portability, efficiency, and measurement accuracy. The instrument is fully portable and can be used in the most remote locations. The instrument is available with carrying cases (which will fit in the overhead bin of most jet aircraft), rechargeable batteries, battery charger, instrument inspection head, display unit, and an operator vest.



The table below lists specifications for the TESA 2000.

Emittance wavelength <3um to >35um (not limited by filters, windows, etc.)
Reflectance wavelength 250 to 2500 nm
Measurement accuracy (for specular and diffuse samples) - ± 1% of full scale for gray samples
- ± 3% of full scale for non-gray samples
Repeatability - ± 0.5% of full scale or better
Sample type Any Sample, including foils, insulators, etc.
Sample size and geometry -Flat Surfaces: ≥ 0.4 inches (1 cm) diameter
Sample temperature Room Temperature, Ambient
Readouts

-Digital LCD panel meter
-Selectable solar reflectance solar absorption and IR reflectance/emittance display

Measurement range (reflectance) 0.05 to 1.00

Dimensions

-Optical Head: 5" diameter x 8" long
-Control and Display Unit: 7.5 x 5.5 x 3 inches
-Battery Box: 7.5 x 6.25 x 4.0 inches
-Carry Case: 12.5 x 17 x 11 inches

Weight -Optical Head: 6 pounds
-Control and Display Unit: 3.25 pounds
-Battery Box: 11 pounds
-Carry Case: 9 pounds
Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **The TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding more capabilities and increased portability

LPSR300 便携式光谱反射测试仪 (近红外)
Label阅读: 1086

LPSR 即Laboratory Portable SpectroReflectometer,独特的采用积分球设计对大部分的材料表面进行半球光谱反射率快速测定,光谱范围250 to 2800 nm 。主要根据ASTM E903 规范,对太阳吸收进行测定 .可同时提供用于真空环境测试版本 LPSR 300V.

LPSR 300 采用Windows XP 操作系统傻瓜式图形操作界面。自动操作模式可以选择波长起止范围,步进间距。结果显示为不同波长的反射率值,并自动计算太阳吸收。手动模式可选择光源、探测器、狭缝宽度及增益。

LPSR 300 是一个独立的测试系统,无需其它硬件。系统提供外接显示器和键盘接口。内置硬盘可存储几千次样品扫描测试结果,非常适合野外和实验室环境使用。

 LPSR300 同时系统集成了光学数据库,可以和测试的结果进行比对。

 

LPSR是根据NASA需求设计研制,用于俄罗斯MIR空间站太空行走

Wavelength 250 to 2800 nm
Monochromatic Type Prism, with selectable wavelength and slit width
Repeatability -250 to 2500 nm- ± 1%
-2500 to 2800 nm- ± 2 %
Sample sizes 0.5 inches in diameter or larger
Measurement type Spectral Total Hemispherical Reflectance
Spectral resolution with automatic slit control

-250 to 2500 nm - better than 5% of wavelength
-2500 to 2800 nm - better than 8% of wavelength

Full scan measurement time Less than 2 minutes
Power required 115 VAC/60 Hz

Dimensions

-Measurement Head: 10 x 12 x 8 inches
-PC/Power Box: 9 x 16 x 20 inches
-Instrument Head Carrying Case: 10 x 11.5 x 16 inches

Weight -Measurement Head: 15 Pounds
-PC/Power Box: 35 Pounds
Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. Spectroreflectometer, spectro-reflectometer and spectral reflectometer are also used interchangeably. (Alternative option to SOC, 410, 400T, directional reflectometer

SPECTRAFIRE 中远红外反射率测试仪
Label阅读: 1090

● SPECTRAFIRE 解决了远红外测试时使用积分球造成 的能量损耗问题。

● SPECTRAFIRE可以测试毛玻璃、半透明聚合物薄膜 等非透明样品

● SPECTRAFIRE可以容易的安装到客户现有的Thermo Nicolet FTIR 红外光谱仪上

 

SPECTRAFIRE 是一个远红外反射率测试附件,可装配到 Thermo-Nicolet 的FTIR 光谱仪上,使用傅里叶变 换的方法进 行光谱半球反射率测试,其中使用了AZ 公司专利 的 ellipsoidal Collection半球能量收集技术,避免了传统的积分球技术对能 量的吸收损耗问题。仪器可从1.67um 到40um的范围内扫描测 试近法向半球反射率。所有的空间都可以被清除以最小化由于水和CO2造成的信号损失。法向发射率根据测试的光谱反射率数据和黑体曲线进行计算。

SPECTRAFIRE 有2种测试模式,绝对测量模式和相对测量 (差分式)模式。在绝对测量模式中,近法向如射,半球反射率通过与配有校正臂的内置探测器直接测到。在这种情况下,无需校正。在相对测量(差分式)模式下,内置校正臂不起作用,而是提供一个参考样品进行背景扣除,然后测试样品。

此外,该系统通过特殊标定的参考根据样品的光谱,来得到不透明样品的总半球发射率。使用Spectrafiar计算发射率并不需要知道光源的光谱,也不一定需要限定光源的色温在300K. SPECTRAFIRE 还可以用于正确的测量300K以外的发射率和非灰体的 发射率。

准直的红外光束从Nicolet红外光谱仪进入到SPECTRAFIRE左边的入口处。通过一个离轴抛物面镜将该光束汇聚到样品上。样品口在系统的顶部,样品置于专利的收集器的顶部。入射光经样品反射并被收集汇聚到探测器上。探测器的信号由FTIR光谱仪进行处理。.在收集器里还内置一个光束偏离装置,用于绝对测量时的背景扣除。该偏离装置的反射率完全匹配收集器的反射率 。仪器里面的所有光学元件都镀了非保护性金膜,以获得在测试光谱范围内的最大反射率。

Spectral resolution 0.5 to 32/cm
Spectral range 2.5 to 40 microns (4000 to 250 cm -1 wave number)
Sample size and geometry ≥ 0.33 inches (8.3 mm) diameter

Dimensions: FTIR with SPECTRAFIRE attached.

-Footprint: 33 x 25 inches
-Height: 13.5" at the SPECTRAFIRE sample port

Electrical requirement for Nicolet 120 VAC, 60 Hz
Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. Spectroreflectometer, spectro-reflectometer and spectral reflectometer are also used interchangeably.

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