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Lentino 簡介
Label閱讀: 495

 

SpotOptics 公司的Lentino 系統是基于夏克-哈特曼(Shack-Hartmann )原理的新一代波前測試系統,是非球面鏡和數碼相機鏡頭質量控制的完整解決方案。直徑0.5mm到20mm的光學元件都可測試,并且具有手動、自動調像差校功能。Lentino 測試系統被數碼相機制造商Pentax公司用于Optio series 數碼相機的質量檢測。

可滿足不同波長范圍的檢測需要

  • 390 nm -1100 nm (Vis)
  • 900 nm-1700 nm (NIR)
  • 125 nm-1100 nm (UV)

    應用說明:
  • Elements that can be tested?
    應用領域

    ??Lenses/透鏡
    ??Group of lenses/ 透鏡組(鏡頭)
    ??Aspheric lenses/ 非球面透鏡
    ??Digital camera lenses/ 數碼相機透鏡
    ??Diameter range/ 鏡片直徑??From 0.5 mm to 20 mm
    ??NA range 數值孔徑??About 0.65 to 0.02
    ??Environment 使用環境?實驗室 或 生產線
    ?
    Lentino 功能特點
    Label閱讀: 495
    ?

    Features

    ?
    • 配有2個內置校正光源(一個固定,一個馬達控制),可以采用平行光測試,也可以在被測光學系統的焦點處采用針孔模式測試
    • 根據需要測試的波長范圍,可靈活配置非致冷相機、紅外相機或紫外相機
    • 所有光學元件都安裝在同一光軸上
    • 待測光學元件或系統裝在馬達驅動的2維輔助平臺,可精確定位在光軸位置
    • 標準采樣范圍?30 x 30 spots?+?非致冷相機
    • 最大采樣范圍: 100 x 100 spots
    • 可用于非球面透鏡測試和數碼相機測試
    • Φmax=20mm (平行光測試模式)
    ?

    Software

    ?
    • 自動優化夏克-哈特曼圖像
    • 軟件檢查需要測試參數是否正確
    • 采用2個內置校正光源進行在線校正
    • 根據測試圖像或參照標準進行在線對準
    • 手動或自動在線準直
    • 自動優化曝光時間
    • 波前重建 (用戶選擇去除光學失常)
    • 70 Zernike aberration terms
    • 3 types of Zernike (Standard, Fringe, Annular) and Seidel polynomials can be fit to the data
    • Average of images, coefficients and wavefront to reduce noise
    • Automatic computation of optical quality for three cases:
        (i) tilt or tilt & defocus removed;
        (ii) 7 Zernike terms removed;
        (iii) user-selected Zernike aberrations removed
    • Analysis in real-time (2D and 3D wavefront, Zernike aberrations, spot diagram, residuals)
    • On-line optical alignment of complex optical systems
    • On-line adjustment of spacing between optical elements
    • MTF, PSF, EE (optional)
    • Over 50 graphs to help you interpret the results
    • Output in Text as well as Excel format
    • Creation of test report
    ?
    Lentino 技術指標
    Label閱讀: 495
    Feature  Specification
       
    No of spots with standard camera  30 x 30
       
    Maximum no. of spots (large camera)  100 x 100
       
    Maximum diameter that can be tested  20 mm
       
    Repeatability of measurements of the Zernike polynomials  λ/300
       
    Repeatability of wavefront measurements  λ/200
       
    Accuracy  About λ/10
       
    Absolute precision  Depends on the type of optical element. Typically λ/10 for spherical surfaces
       
    Tilt measurement accuracy (angle, depends on the size of optical element)  4祌ad
       
    Wavelength range  0.35 μ -1.1 μ
       
    Dynamic range of measurements by sub-pupil (tilt subtracted, depends from combination of aberrations)  ~ ± 50 λ
       
    Asphericity range  About 15% variation in LSA (longitudinal spherical aberration)
       
    Acquisition speed (standard camera). Faster speeds available on request  4 Hz
       
    Mounting option  Can be mounted vertically or horizontally
       
    Mounting of optical elements  Optical system to be tested easily mounted on central mounting slide
       
    Easy access to optical elements  Access to the mounting plate of Lentino is from the front of the instrument
       
    Dimensions (L x W x H)  22 x 20 x 60 cm
       
    Weight(approximate)  15 Kg
       
    Input voltage (for motor movement)  Power supply 500 mA, 9 V


         
     
     : Puntino 天文望遠鏡調校系統產品一覽: OMI 波前探測器 
     
         
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