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Lab setting where samples may be sat atop unit.
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Portable usage with battery pack and vest
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TESA2000是在TEMP 2000A基礎上增加光譜半球反射率測定功能，光譜范圍250 nm to 2500 nm ，主要用于材料太陽光譜吸收、反射特性測試。
AZ Technology's TESA 2000 Portable Emissometer/Reflectometer and Solar Reflectometer, is compact, lightweight, rugged, and ergonomically engineered for ease of use in the field or in the laboratory to determine ambient temperature total emittance and solar reflectance of test surfaces.
The TESA 2000 can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken, or as a portable unit (bottom right image).
The TESA 2000 provides in a single unit:
1) A portable emissometer/reflectometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Thus, performing the same measurement as the TEMP 2000A (the recognized replacement for the no longer produced Gier Dunkle DB-100 IR Reflectometer**), providing improved emittance determination performance and maintainability, and in accordance with the ASTM E408 standard.
2) A portable solar reflectometer that performs optically integrated total hemispheric reflectance measurements.
The TESA 2000 optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology's patented ellipsoid collector (Patent Number 5,659,397) that allows compactness for portability, efficiency, and measurement accuracy. The instrument is fully portable and can be used in the most remote locations. The instrument is available with carrying cases (which will fit in the overhead bin of most jet aircraft), rechargeable batteries, battery charger, instrument inspection head, display unit, and an operator vest.
The table below lists specifications for the TESA 2000.
| Emittance wavelength |
<3um to >35um (not limited by filters, windows, etc.) |
| Reflectance wavelength |
250 to 2500 nm |
| Measurement accuracy (for specular and diffuse samples) |
- ± 1% of full scale for gray samples
- ± 3% of full scale for non-gray samples |
| Repeatability |
- ± 0.5% of full scale or better |
| Sample type |
Any Sample, including foils, insulators, etc. |
| Sample size and geometry |
-Flat Surfaces: ≥ 0.4 inches (1 cm) diameter |
| Sample temperature |
Room Temperature, Ambient |
| Readouts |
-Digital LCD panel meter
-Selectable solar reflectance solar absorption and IR reflectance/emittance display
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| Measurement range (reflectance) |
0.05 to 1.00 |
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Dimensions
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-Optical Head: 5" diameter x 8" long
-Control and Display Unit: 7.5 x 5.5 x 3 inches
-Battery Box: 7.5 x 6.25 x 4.0 inches
-Carry Case: 12.5 x 17 x 11 inches
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| Weight |
-Optical Head: 6 pounds
-Control and Display Unit: 3.25 pounds
-Battery Box: 11 pounds
-Carry Case: 9 pounds |
| Warranty |
1 year parts and labor |
*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **The TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding more capabilities and increased portability | 
"The simplest method of determining emittance is with a portable infrared reflectometer such as the [Gier Dunkle] DB100 or the AzTek [AZ Technology] Temp 2000."
